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21 September 2015 21:43 Age: 2 yrs

Advanced Characterization Methods for PV

Freiburg, Fraunhofer ISE - January, 14th 2016

More information here

 

Temporary agenda

 

Session I: Materials

1.1 I. Lauerman, HZB (D), “X-ray based analysis of PV materials and components"

1.2 B. Bissig, EMPA (CH), “Electron beam induced current and time resolved photoluminescence technique for thin film solar cell characterization

1.3 C. del Cañizo, UPM (ES). “Characterization of intermediate band materials and solar cells

1.4 S. Binetti, Unimib (I), “Photoluminescence and Raman spectroscopy for defect identification in Silicon, CIGS and CZTS thin films

1.5 V. Jordi, CEA INES (F), “Characterization of oxygen-related defects in high-efficiency Czochralski silicon wafers

1.6 PV Material Discussion and Idea Generation Forum 

 

Session II: Solar Cells & Modules

2.1 S. Gevorgyan, DTU (DE), “Characterization of organic solar cells: Mechanical, electrical and photovoltaic stability

2.2 I. Gordon, IMEC (BE), “Advanced material and device characterization techniques for Silicon and thin-film based photovoltaics

2.3 F. Castro, NPL (GB), “Identification of degradation and manufacturing issues using multi-parameter mapping of organic solar cells

2.4 K. Bittkau, FZ Juelich (D), “Electro-optical Characterization of Thin-film Solar Cells and Modules: From nanophotonic cell characterization to macroscopic module characterization

2.5 Solar Cell Discussion and Idea Generation Forum

 

Session III: Modules & Systems

3.1 M. Machado, Tecnalia (ES), “Analytical prediction of photovoltaic modules efficiency for different encapsulation schemes

3.2 M. Rennhofer, Austrian Institute of Technology AIT (AU), “Degradation and electric behavior in thin film photovoltaic devices

3.3 N. Talyor, EC Joint Research Center (BE), “Precision PV Performance Assessment at the JRC's European Solar Test Installation

3.4 J. Kroon, ECN (NL), “Accurate yearly yield calculation using PV module fingerprint method applied for MWT, H-pattern and thin film modules

3.5 G. Halabalakis, CRES (GR), “CRES's labs for PV system characterization and analysis

3.6 Solar Systems Discussion and Idea Generation Forum